Electron and scanning probe imaging
Instructor: Prof. David Carroll
Location: Nanotech Lecture Hall, 501 Deacon
1.5 credit hour with lab
offered every other year or as requested
PHY 656 Electron Imaging Science
PHY 657 Scanning Probes
These course teach the basic theory and practice of microscopy using electron microscopes and scanning probe microscopes. (656) an Introduction to electron imaging with hands-on experience using TEM and SEM instruments. (657) The theory and practice of STM, and AFM, again with a lab component for hands-on experiential learning. They should provide a working knowledge of the use of the instruments as well as the basis for interpretation and simulation of data.
The courses are taught in an open structure, usually with only lab reports as graded components and only attendance needed for a passing grade. The courses are supposed to be utilitarian, for students needing to use these instruments in research, and are presented in a way which is enjoyable.
This course is required for user certification at NANOTECH